Numerical calculations, near or far field, for the interference produced by the interaction of laser light with an array of N-slits. These computations are particularly applicable to the characterization of N-slit interferometers. Input paramenters include: wavelength, slit dimensions, number of slits, distance from the slit array, or grating, to the interference plane. Graphical output includes the central and secondary diffraction orders.
An additional application is the characterization of the emission transverse-mode structure in laser oscillators and/or laser resonators. In other words, the cavity and emission beam geometry can be optimized to achieve single-transverse-mode emission at maximum efficiency. This is a powerful design tool that saves time, resources, and effort in laser architecture and engineering.