Interferometric Optics

N-Slit Laser Interferometer

Interferometric Optics introduces its N-Slit Laser Interferometer (NSLI) applicable to: Based on multiple-prism beam expansion and digital detection the N-slit interferometer allows for the rapid interferometric characterization of transmission optical surfaces in general. A significant advance over traditional point-by-point incoherent microdensitometers and point-by-point incoherent microscopes. Specifications are given in [PDF].



Specific applications include the rapid characterization of:
  • Arrays of micro holes and/or micro nozzles
  • Biomedical and organic molecular arrays
  • Crystalline surfaces
  • Molecular, and digital, imaging surfaces
  • Optical surfaces
  • Textiles
  • Transmission gratings
Spatial resolution depends on the selected CCD or CMOS detector. As explained in the references, the resolution provided by the detector array can be enhanced, via quantum interferometric calculations, into the submicrometer or nanometer regime thus making the transition from microscope to nanoscope.


References

Interferometric Optics
Introduction
Products
Expertise
Optical Metrology for Inkjet Printers and Laser Printers
Optics Journal
Tunable Lasers
Contact




Published on the 13th of September, 2009; updated on the 27th of March, 2013.